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Solido provides variation analysis and design software for custom IC’s so that our customers can achieve maximum yield and performance in their designs. Solido’s product, Variation Designer, boosts SPICE simulator efficiency while increasing design coverage. Solido Variation Designer is being used by top semiconductor companies to design memory, standard cell, analog/RF, custom digital and low power custom IC designs at leading design nodes including TSMC and GLOBALFOUNDRIES 40nm, 28nm, 20nm, 16nm
Memory Solution
Hierarchical Monte Carlo
Verify full-chip memories with perfect statistical accuracy with Solido’s newest memory technology

  • Virtual statistical reconstruction of full-chip memory from critical paths
  • Correctly accounts for both global and local variation
  • Includes loading, leakage, and layout effects
  • Explores design performance at each level of hierarchy
High-Sigma Monte Carlo
Verify columns, bitcells, sense amps, and other memory blocks to high-sigma quickly and with perfect Monte Carlo and SPICE accuracy

  • High-capacity - goes beyond the bitcell to verify to memory columns and critical paths
  • Works with pass/fail, binary, and multi-modal output measurements
  • Enables efficient debugging of high-sigma variation problems
  • Produces trustworthy high-σ verification results
Standard Cell Solution
High-Sigma Monte Carlo
Fast, accurate, scalable, and verifiable high-sigma verification of standard cell libraries

  • Analyzes billions of Monte Carlo samples in minutes, with full SPICE accuracy
  • Scales to industrial-sized circuits with thousands of active devices
  • Extracts full high-sigma distribution
  • Supports binary and multimodal outputs
  • Provides trustworthy high-sigma verification results
Cell Optimizer
Fast, accurate optimization of standard cells

  • Provides high-quality results quickly, with full SPICE accuracy
  • Optimizes across multiple PVT and 3-6σ statistical corners simultaneously
  • Flexible setup accommodates different variables, objectives, and constraints
Fast Monte Carlo
Fast, accurate 3-sigma verification and corner extraction

  • Quickly analyzes 3-sigma performance
  • Efficient batch operation on full library
  • Correctly handles non-Gaussian distributions
Analog/RF Solution
Statistical PVT
Delivers unprecedented coverage of process variation and operating conditions

  • Accurately bounds analog/RF performance
  • Creates analog design- and output-specific statistical corners
  • Includes both 3σ global and 3σlocal/mismatch variation
  • Extremely convenient & easy to adopt
  • Interactive visualization of device and parameter sensitivity
Fast Monte Carlo
Fast, accurate 3-sigma verification and corner extraction

  • Fast extraction of statistical corners that correctly bound analog performance
  • Fast, accurate 3-sigma statistical verification
  • Intuitive visual exploration of performance distributions
Fast PVT
2-50x faster verification across PVT corners

  • Scales to 1M+ PVT corner combinations
  • Accounts for multiple power modes, parasitics, double-patterning
  • Interactive analysis of parameter impacts
High-Sigma Monte Carlo
Fast, accurate, scalable, and verifiable high-sigma Monte Carlo verification and design

  • ? Analyzes thousands, millions, or billions of Monte Carlo samples in minutes, with full Monte Carlo & SPICE accuracy
  • High-capacity ? scales to thousands of active devices and beyond
  • Extracts the full high-sigma distribution
  • Supports pass/fail, binary, and multimodal outputs
  • Produces trustworthy high-sigma verification results